How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors at Salimpour Site.

Dr. Salimpour Site |AFM-IR combines atomic force microscopy and infrared spectroscopy for precise nanoscale chemical analysis, crucial for semiconductor research and production.

AZO Nano

How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors
How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors

AFM-IR combines atomic force microscopy and infrared spectroscopy for precise nanoscale chemical analysis, crucial for semiconductor research and production.

2025-09-16

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