Researchers Link Thicker Aluminum Electrodes to Two-Thirds Lower TLS Density in Josephson Junctions in ssalimpour

Salimpour Website |Researchers developed a high-throughput workflow that combined cryogenic spectroscopy, automated statistical analysis, and scanning transmission electron microscopy to link fabrication conditions and junction microstructure to the strongly coupled two-level system (TLS) density

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Researchers Link Thicker Aluminum Electrodes to Two-Thirds Lower TLS Density in Josephson Junctions

Researchers Link Thicker Aluminum Electrodes to Two-Thirds Lower TLS Density in Josephson Junctions

Researchers developed a high-throughput workflow that combined cryogenic spectroscopy, automated statistical analysis, and scanning transmission electron microscopy to link fabrication conditions and junction microstructure to the strongly coupled two-level system (TLS) density across about 6,000 Al/AlOx/Al Josephson junctions. They found that thicker aluminum electrodes and larger grains were associated with an approximately two-thirds lower detectable TLS density, while the precise microscopic cause remains unresolved.